As chips get ever bigger and more complex, the electronic design automation (EDA) industry must innovate constantly to keep up. Engineers expect every new generation of silicon to be modeled, ...

Design for Test (DFT) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier ...

ATPG can generate a less vector-intensive test to verify that an IC has been manufactured correctly. This test toggles all inputs and outputs, turns all three-state drivers on and off, reads out ...

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

Low-power design and fast testing at the fab are not happy bedfellows. As Giri Podichetty of Mentor Graphics explains at Semiwiki and in a white paper, “the goal of automatic test pattern generation ...

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...

Today's leading-edge system-on-chip (SoC) designs typically have multiple clock domains and, in many cases, multiple internally generated clocks. In test mode, those clocks may be combined into one, ...