Electronic Design

Design for Test: ATPG keeps pace with design complexity

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
EDN

Optimizing autonomous IC test without sacrificing precision

For many years, there was a passionate debate between some DFT practitioners about which is the best test method—logic built-in self test (BIST) or automatic test pattern generation (ATPG). Recently, ...
Semiconductor Engineering

Can Your ATPG Do This? Cut Defects Escaping Detection With ML

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...
EDN

Cell-aware ATPG test methods improve test quality

Traditional IC pattern-generation methods focus on detectingdefects at gate terminals or at interconnects. Unfortunately, a significantpopulation of defects may occur within an IC's gates, or cells.
Design-Reuse

BIST versus ATPG -- separating myths from reality

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...