Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...

This file type includes high-resolution graphics and schematics when applicable. David J. Rodgers, Ethernet Alliance board of directors, and Senior Product Marketing Manager, Teledyne LeCroy Ethernet ...

Decades of advances in the semiconductor industry continue to drive an insatiable consumer demand for smaller, more powerful, more ubiquitous semiconductor devices—whether in our cars, within our ...

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then ...