It’s no secret that a successful yield ramp directly impacts integrated circuit (IC) product cost and time-to-market. Tools and techniques that help companies ramp to volume faster, while also ...

Pattern matching (PM) was first introduced as the semiconductor industry began to shift from simple one-dimensional rule checks to the two-dimensional checks required by sub-resolution lithography.

Pattern matching is best known for its use in detecting lithographic hotspots, but it’s also widely used across all physical verification flows, and has expanded into design-for-manufacturing (DFM) ...

An algorithm, which determines the range of a preceding vehicle by a single image, had been proposed. It uses a "Range-Window Algorithm". Here in order to realize higher robustness and stability, the ...

This paper describes an exact algorithm for the fixed charge transportation problem based on a new integer programming formulation that involves two sets of variables representing flow patterns from ...