The FEI 200kV Titan Themis Scanning Transmission Electron Microscope (STEM) is a scanning transmission electron microscope with several key capabilities. This microscope positions Michigan Tech ...
The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large-chamber, tungsten source, environmental scanning electron microscope capable of high and low vacuum imaging. The FEI Philips ...
Through a novel combination of machine learning and atomic force microscopy, researchers in China have unveiled the molecular ...
Open the Youtube video In a quiet lab at Argonne National Laboratory, Saw-Wai Hla and his team were huddled around their instruments late one night when they detected the spectral signature they had ...